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DAC39J82IAAVR датащи(PDF) 6 Page - Texas Instruments |
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DAC39J82IAAVR датащи(HTML) 6 Page - Texas Instruments |
6 / 147 page DAC39J82 SLASE47 – JANUARY 2015 www.ti.com Pin Functions (continued) PIN I/O DESCRIPTION NAME NUMBER Internal clock buffer supply voltage (0.9V). It is recommended to isolate this supply from VDDCLK09 A8, B8 I VDDDIG09. D9, E9, F9, G9, VDDDAC09 I DAC core supply voltage. (0.9V). It is recommended to isolate this supply from VDDDIG09. H9, J9 J7, J6, D5, J5, Digital supply voltage. (0.9V). It is recommended to isolate this supply from VDDCLK09 and VDDDIG09 D4, E4, F4, G4, I VDDDAC09. H4, J4, D3 VDDIO18 K7, K6 I Supply voltage for all digital I/O and CMOS I/O. (1.8V) VDDR18 F2, G2 I Supply voltage for SerDes (1.8V) VDDS18 C7, C6 I Supply voltage for LVDS SYNCBP/N (1.8V) VDDT09 F3, G3 I Supply voltage for SerDes termination (0.9V) Fuse supply voltage. This supply pin is also used for factory fuse programming. Connect to VQPS18 D7, D6 I 1.8V. VSENSE C4 I/O Analog test pin for on chip parametric. It can be left open if not used. 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) MIN MAX UNIT VDDDAC09, VDDDIG09 –0.3 1.3 V VDDCLK09 –0.3 1.3 V VDDT09 –0.3 1.3 V Supply voltage(2) VDDR18, VDDIO18, VDDS18, VQPS18 –0.3 2.45 V VDDAPLL18, VDDAREF18 –0.3 2.45 V VDDADAC33 –0.3 4.0 V RX[7..0]P/N –0.5 V VDDT09 + 0.5 V V SDENB, SCLK, SDIO, SDO, TXENA, ALARM, RESETB, SLEEP, TMS, –0.5 V VDDIO18 + 0.5 V V TCLK, TDI, TDO, TRSTB, TESTMODE, SYNC_N_AB, SYNC_N_CD DACCLKP/N, SYSREFP/N –0.5 V VDDAPLL18 + 0.5 V V SYNCBP/N –0.5 V VDDS18 + 0.5 V V Pin voltage(2) LPF –0.5 V VDDAPLL18 + 0.5 V V IOUTAP/N, IOUTBP/N, IOUTCP/N, IOUTDP/N –0.5 V 1.0 V V RBIAS, EXTIO, ATEST –0.5 V VDDAREF18 + 0.5 V V IFORCE, VSENSE –0.5 V VDDDIG09 + 0.5 V V AMUX1, AMUX0 –0.5 V VDDT09 + 0.5 V V Peak input current (any input) 20 mA Peak total input current (all inputs) –30 mA Absolute maximum junction temperature TJ 150 °C Operating free-air temperature range, TA: DAC39J82 –40 85 °C (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only and functional operation of these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) Measured with respect to GND. 6 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated Product Folder Links: DAC39J82 |
Аналогичный номер детали - DAC39J82IAAVR |
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Аналогичное описание - DAC39J82IAAVR |
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