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FEATURES

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16

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S

1B1

1B2

1A

2B1

2B2

2A

GND

OE

4B1

4B2

4A

3B1

3B2

3A

PW PACKAGE

(TOP VIEW)

DESCRIPTION/ORDERING INFORMATION

SN74CBTLV3257-EP

LOW-VOLTAGE 4-BIT 1-OF-2 FET MULTIPLEXER/DEMULTIPLEXER

• 5-Ω Switch Connection Between Two Ports

• Controlled Baseline

• Rail-to-Rail Switching on Data I/O Ports

–

One Assembly Site

• I

Operation

–

One Test Site

• Latch-Up Performance Exceeds 100 mA Per

–

One Fabrication Site

JESD 78, Class II

• Extended Temperature Performance of

• ESD Protection Exceeds JESD 22

–55

°C to 125°C

–

2000-V Human-Body Model (A114-A)

• Enhanced Diminishing Manufacturing Sources

(DMS) Support

–

200-V Machine Model (A115-A)

• Enhanced Product-Change Notification

(1)

Component qualification in accordance with JEDEC and

industry standards to ensure reliable operation over an

extended temperature range. This includes, but is not limited

to, Highly Accelerated Stress Test (HAST) or biased 85/85,

temperature cycle, autoclave or unbiased HAST,

electromigration, bond intermetallic life, and mold compound

life. Such qualification testing should not be viewed as

justifying use of this component beyond specified

performance and environmental limits.

The SN74CBTLV3257 is a 4-bit 1-of-2 high-speed FET multiplexer/demultiplexer. The low on-state resistance of

the switch allows connections to be made with minimal propagation delay.

The select (S) input controls the data flow. The FET multiplexers/demultiplexers are disabled when the

output-enable (OE) input is high.

current does not backflow through the device when it is powered down. The device has isolation during power

off.

resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2008, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

On products compliant to MIL-PRF-38535, all parameters are

Instruments standard warranty. Production processing does not

tested unless otherwise noted. On all other products, production

necessarily include testing of all parameters.

processing does not necessarily include testing of all parameters.