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TS-5020 датащи(PDF) 7 Page - Keysight Technologies |
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TS-5020 датащи(HTML) 7 Page - Keysight Technologies |
7 / 9 page 7 Three modes The TS-5020 enables three different modes for performing UUT-assisted test. The best choice of mode depends on the test stimulus source and response destination. – Serial link evaluation: This mode simply evaluates the serial link and microcontroller. Commands sent to the microcontroller over the serial link prompt a response that is sent back to the test system. The system then verifies the response and may perform a full CRC memory check. Parametric tests may also be run to test serial link characteristics such as delay, rise or fall time, and input impedance. – I/O status evaluation: This mode uses the test system I/O to determine ECM input states. It does this by sending a message over the serial link to the ECM prompting it to run a test routine. For example, this mode may be used to apply an analog input to the ECM to verify A/D conversion and the module’s handling and communication of data over the serial link. (For example, the analog input may be a simulation of a sensor’s output for air temperature.) In this mode, the test system can use UUT-assisted testing to assess proper functioning of several functions at once, including the controller, serial link, A/D and waveform processing circuitry. – Input evaluation: In this mode, the test system supplies an input then reads the value at either the input or output of the module. The evaluation can verify proper receipt of the signal at the module input or if the input cause the appropriate output. Throughput multiplier The throughput multiplier test strategy (multiple-up UUT testing) is one way to increase throughput for a manufacturing environment. Multiple UUT testing not only consolidates tasks common to multiple modules, such as load/unload, instrument setup of signal and load routing, it’s also an effective strategy for overlapping inherent latencies in the UUT or test system [shown in figures 5 and 6]. Reduce total test cost Test cost is only one factor in reducing the total cost of manufacturing an ECM. However, it is the tangible cost that can be reduced by test engineering to reduce cost times, equipment costs and floor space. The TS-5020 answers the call by delivering reduced integration costs, floor space and test times. With the volume increase in safety, security and convenience modules, manufacturers are looking for ways to meet their line-production rate without building up inventory on the production line. Using the throughput multiplier for parallel multiple-up testing of ECMs not only reduces floor space and increases asset utilization, it decreases test times per ECM. Instrumentation hardware is often believed to be the most significant contributor to test cost, but that may not always be the case. Hidden costs of software engineering time, operating costs and maintenance expenses must also be considered in the cost equation. Operation costs include management, facilities, and the skilled personnel needed to run the test systems. With a standard platform of hardware and software, support and training costs are lower than with a unique, custom-built system. UUT1 UUT2 UUT1 UUT2 Load UUT Power Setup instrument Load UUT Power Setup instrument Load UUT Power Setup instrument UUT setup Delay Measure UUT setup Delay Measure UUT setup Delay Measure Unload UUT Unload UUT Unload UUT Load UUT Power Setup instrument UUT setup Delay Measure Unload UUT Time Time Figure 5. Single-uptesting of two or more UUTs. Figure 6. Multi-up testing of two or more UUTs. |
Аналогичный номер детали - TS-5020 |
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Аналогичное описание - TS-5020 |
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