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CAT25M02 датащи(PDF) 2 Page - ON Semiconductor

номер детали CAT25M02
подробное описание детали  2 Mb SPI Serial CMOS EEPROM
Download  14 Pages
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производитель  ONSEMI [ON Semiconductor]
домашняя страница  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

CAT25M02 датащи(HTML) 2 Page - ON Semiconductor

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CAT25M02
www.onsemi.com
2
DEVICE MARKINGS
SOIC−8 Package
25M02A = Specific Device Code
A = Assembly Site
Y = Year of Production, Last Number
M = Assembly Operation Month
ZZZ = Assembly Lot Number, Last Three Numbers
WLCSP−8 Package
2MSA = Specific Device Code
A = Assembly Site
L = Wafer Lot Number
Y = Year of Production, Last Number
W = Work Week Number
25M02A
AYMZZZ
2MSA
ALYW
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameters
Ratings
Units
Operating Temperature
–40 to +125
°C
Storage Temperature
–65 to +150
°C
Voltage on any Pin with Respect to Ground (Note 1)
–0.5 to +6.5
V
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. The DC input voltage on any pin should not be lower than −0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may
undershoot to no less than −1.5 V or overshoot to no more than VCC + 1.5 V, for periods of less than 20 ns.
Table 2. RELIABILITY CHARACTERISTICS (Note 4)
Symbol
Parameter
Min
Units
NEND (Notes 2, 3)
Endurance
1,000,000
Program/Erase Cycles
TDR
Data Retention
100
Years
2. Page Mode, VCC = 5 V, 25°C.
3. The device uses ECC (Error Correction Code) logic with 6 ECC bits to correct one bit error in 4 data bytes. Therefore, when a single byte
has to be written, 4 bytes (including the ECC bits) are re−programmed. It is recommended to write by multiple of 4 bytes located at addresses
4N, 4(N+1), 4(N+2), 4(N+3), in order to benefit from the maximum number of write cycles.
4. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100
and JEDEC test methods.


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